Title: Pattern analysis of phase wise occurrence, severity and detection of failures in real time embedded projects

Authors: Samitha Khaiyum; Y.S. Kumaraswamy; K. Karibasappa

Addresses: Department of Master of Computer Applications, Dayananda Sagar College of Engineering, Kumaraswamy Layout, Bangalore-560078, India ' Department of Master of Computer Applications, Dayananda Sagar College of Engineering, Kumaraswamy Layout, Bangalore-560078, India ' Dayananda Sagar College of Engineering, Kumaraswamy Layout, Bangalore-560078, India

Abstract: Software engineering aims to ensure quality management to reduce cost of failures. The quality management system brings together functions, objectives and activities that maintain quality. Despite these strategies, failures do occur. A failure can be viewed as conceptual, technological and organisational failures. In order to reduce the chance of failure, it is necessary to identify the type of failure and its occurrence, detection and severity pattern. This paper presents a case-study of real time embedded projects, developed in CMMI level 4 and 5 software industries. The aim of this work is to emphasis upon different types of failures occurrence pattern, its severity and detection level to predict during software development process in real time embedded system projects enabling one to monitor, control and manage project failures. Areas which need attention to increase quality and productivity of the project are identified to improve customer satisfaction and survivability in the market.

Keywords: software engineering; failure mode and effects analysis; FMEA; failure management; software quality; real time embedded systems; software projects; failure occurrence; failure severity; failure detection; quality management; failure patterns; software development; project failures.

DOI: 10.1504/IJPQM.2016.073274

International Journal of Productivity and Quality Management, 2016 Vol.17 No.1, pp.36 - 60

Received: 28 Mar 2014
Accepted: 14 Jun 2014

Published online: 30 Nov 2015 *

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