Title: A repetitive group sampling plan by variables inspection for product acceptance determination
Authors: Chien-Wei Wu; Muhammad Aslam; James C. Chen; Chi-Hyuck Jun
Addresses: Department of Industrial Engineering and Engineering Management, National Tsing Hua University, No. 101, Section 2, Kuang-Fu Road, Hsinchu 30013, Taiwan ' Department of Statistics Forman Christian College University, Room 423, Armacost Science Building, Feroze Pur Road, Lahore 54000, Pakistan ' Department of Industrial Engineering and Engineering Management, National Tsing Hua University, No. 101, Section 2, Kuang-Fu Road, Hsinchu 30013, Taiwan ' Department of Industrial and Management Engineering, POSTECH, No. 77 Cheongam-ro, Pohang 790-784, Korea
Abstract: Acceptance sampling plans are practical tools for quality assurance applications and provide the producer and the consumer a general rule for lot sentencing to meet their requirements of product quality. A well-designed acceptance sampling plan not only reduces the cost and time of inspection but also provides the desired protection to the producer and the consumer. Thus, a sampling plan having smaller sample size required for inspection would be more desirable and useful especially when inspection is costly and destructive. This paper proposes an efficient and economic variables repetitive group sampling (RGS) plan based on the capability index Cpk for lot sentencing. The advantages of the proposed variables RGS plan over existing variables single sampling plan are discussed. Finally, to illustrate the applicability of the proposed variables RGS plan, an example is also provided. [Received 20 October 2012; Revised 21 February 2014; Accepted 25 February 2014]
Keywords: acceptance sampling; decision making; fraction of defectives; process capability indices; PCIs; quality assurance; lot sentencing; repetitive group sampling; sampling plans; variables inspection; product acceptance.
European Journal of Industrial Engineering, 2015 Vol.9 No.3, pp.308 - 326
Available online: 12 May 2015 *Full-text access for editors Access for subscribers Purchase this article Comment on this article