Title: Admission control of bulk retrial feedback queue with K-optional vacations

Authors: Shweta Upadhyaya

Addresses: Department of Mathematics, Amity Institute of Applied Sciences, Amity University, Sector-125, Noida-201301 (U.P.), India

Abstract: In this study, we have made an attempt to provide a ready reckoner for solving many congestion problems of day-to-day life under techno-economic constraints which can be seen in many industrial organisations and computer and communication systems. This can be made possible by designing a control policy called Bernoulli Admission Control Policy (BACP) wherein one can control the arrival rate of the customers by allowing only some of them to enter the system. We have applied this policy to a bulk retrial queueing system with Bernoulli feedback under Bernoulli vacation schedule. For the proper utilisation of the server's resources, there is a provision for the server to go for a fixed number of optional vacations (say K) depending upon its choice. We have provided a numerical simulation for solving the problem dealing with local area networks (LAN) especially relating to mobile IP. The service time, repair time, vacation time and setup time are assumed to be generally distributed. We have used supplementary variable technique (SVT) and probability generating function (PGF) method to compute various queueing and reliability measures of interest.

Keywords: retrial queues; batch arrivals; two-phase services; admission control; Bernoulli feedback; K-optional vacations; unreliable servers; arrival rate control; bulk retrial queueing; Bernoulli vacation schedule; numerical simulation; local area networks; LANs; mobile IP; service times; repair times; vacation times; setup times; supplementary variable technique; SVT; probability generating function; PGF; reliability measures.

DOI: 10.1504/IJMOR.2015.068293

International Journal of Mathematics in Operational Research, 2015 Vol.7 No.2, pp.215 - 239

Received: 01 Jun 2013
Accepted: 16 Sep 2013

Published online: 22 Apr 2015 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article