Title: Facility location selection using complete and partial ranking MCDM methods

Authors: Ankita Ray; Arijit De; Pranab Kr. Dan

Addresses: Department of Industrial Engineering and Management, West Bengal University of Technology, BF Block, Sector 1, Salt Lake City, Kolkata-700064, India ' Department of Industrial Engineering and Management, West Bengal University of Technology, BF Block, Sector 1, Salt Lake City, Kolkata-700064, India ' Department of Industrial Engineering and Management, West Bengal University of Technology, BF Block, Sector 1, Salt Lake City, Kolkata-700064, India

Abstract: Location planning is one of the essential tasks for a manufacturing industry. There are various factors that influence the selection of the location for a plant or service facility. Multi criteria decision making (MCDM) analysis is an optimisation technique which is applied to identify the most preferred alternative under multiple criteria. In this paper, some MCDM methods such as TOPSIS, SAW, GRA and MOORA have been used to determine the best location. Finally, an outranking MCDM approach (ELECTRE-I) is applied to find an appropriate plant location. The applied complete ranking MCDM methods are considered as the criteria and the evaluated values are taken as the performance of the decision matrix. By using these elements the ELECTRE-I method has been applied. A numerical example is taken to demonstrate the procedural steps of MCDM methods for selecting the best alternative for service facility or factory location.

Keywords: facility location; multicriteria decision making; MCDM tools; TOPSIS; simple additive weighting; grey relational analysis; GRA: multi-objective optimisation; MOORA; ELECTRE-I; manufacturing industry; plant location; location selection.

DOI: 10.1504/IJISE.2015.067251

International Journal of Industrial and Systems Engineering, 2015 Vol.19 No.2, pp.262 - 276

Received: 08 May 2013
Accepted: 16 Sep 2013
Published online: 02 Feb 2015 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article