Authors: Michaël Lauer; Frédéric Boniol; Claire Pagetti; Jérôme Ermont
Addresses: LAAS-CNRS, Université de Toulouse, 7, avenue du Colonel Roche BP 54200, 31031 Toulouse Cedex 4, France ' ONERA, 2, avenue Edouard Belin BP 4025, F31055 Toulouse, France ' ONERA, 2, avenue Edouard Belin BP 4025, F31055 Toulouse, France ' IRIT-INPT/ENSEEIHT, 2, rue Camichel BP 7122, 31071 Toulouse Cedex 7, France
Abstract: Critical embedded systems are often designed as a set of real-time tasks, running on shared computing modules, and communicating through networks. Because of their critical nature, such systems have to meet strict timing properties. To help the designers to prove the correctness of their system, the real-time systems community has developed numerous approaches for analysing the worst case scenarios either on the processors (e.g., worst case response time of a task) or on the networks (e.g., worst case traversal time of a message). These approaches provide results only for local components behaviours. However, there is a growing need for having a global view of the system, in order to determine end-to-end properties. Such a property applies to functional chains which describe the behaviour of sequences of tasks. We propose an approach to analyse worst case behaviour along functional chains in critical embedded systems. It is based on mixed integer linear programming (MILP) and is general in the sense that it can be applied to a variety of end-to-end properties. This paper focuses on two essential properties: end-to-end latency and temporal consistency. This work was supported by the French National Research Agency within the SATRIMMAP project.
Keywords: real-time systems; embedded systems; worst-case analysis; temporal consistency; mixed integer linear programming; MILP; end-to-end latency; networked systems; critical systems; functional chains.
International Journal of Critical Computer-Based Systems, 2014 Vol.5 No.3/4, pp.172 - 196
Available online: 03 Sep 2014 *Full-text access for editors Access for subscribers Purchase this article Comment on this article