Title: Scaling performance examination of microcontroller-based conductivity measuring instruments

Authors: Vladimir B. Bokov

Addresses: NPP Automatica JSC, 77 B. Nizhegorodskaya St, City of Vladimir, Russia

Abstract: Conductivity measuring instruments should only be used if they allow carrying out the measurements of required accuracy and format, and are suitable for their measuring environment. This paper introduces a statistical analysis for scaling performance examination of conductivity instruments, enabling analysts to assess if these instruments meet specified requirements. Information is given on how analysts can verify the scaling performance of the instruments using one-way classification analysis of variance and Welch's approximate t-test. Employing these methods as a useful technique in the field of statistical inference, it was shown that there is a strong correlation between the values of relative errors of measurements and scaling performance of the tested conductivity measuring instruments.

Keywords: conductivity measuring instruments; scaling performance; statistical analysis; measurement errors; microcontrollers; conductivity measurement; analysis of variance; ANOVA; approximate t-test.

DOI: 10.1504/IJQET.2014.064404

International Journal of Quality Engineering and Technology, 2014 Vol.4 No.3, pp.243 - 260

Available online: 19 Aug 2014 *

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