Title: Identification of critical success factors for quality-productivity management approach in different industries
Authors: Vinod S. Gorantiwar; R.L. Shrivastava
Addresses: Department of Mechanical Engineering, Yeshwantrao Chavan College of Engineering, Nagpur – 441 110, India ' Department of Mechanical Engineering, Yeshwantrao Chavan College of Engineering, Nagpur – 441 110, India
Abstract: Rapid industrialisation has demanded that the processes that govern quality and productivity be developed at a similar rate, however, quality management approaches have lagged behind and remain a constant case for investigations. In view of this, the role of critical success factor (CSF) identification has been of very high importance. This study has attempted to study the approach of past researchers in identifying the CSFs of total quality management (TQM). Standard methodology was followed to review the published literature. The results indicated that the critical review of literature is the most highly adopted approach and case studies have received relatively less attention. Though the survey was carried out for small, medium, large-scale manufacturing and the service industry, it was apparent from the literature that the integration of various CSFs of TQM can help the manufacturing industries in sustainable quality improvement with the TQM approach. The various CSFs identified for industries are top managements' commitment; continuous improvement; working environment; stakeholders' involvement; quality tools; strategy, policy and planning; information and communication management; employee involvement and empowerment; process monitoring and production development; suppliers' involvement and management; customer involvement and satisfaction; training and development; and support to employees.
Keywords: productivity management; critical success factors; CSFs; total quality management; TQM.
International Journal of Productivity and Quality Management, 2014 Vol.14 No.1, pp.66 - 106
Published online: 26 Jul 2014 *Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article