Title: Estimation of the carbon nanotube concentration by peak-to-background ratio in XRD patterns

Authors: Nguyen Duc Thanh; Phan Hong Khoi; Nguyen Thanh Trung

Addresses: Center for Nuclear Techniques in Ho Chi Minh City (CNT), Vietnam Atomic Energy Commission, 217 Nguyen Trai, Dist. No. 1, Ho Chi Minh City, Vietnam ' Center for High Technology Development, Vietnam Academy of Science & Technology, 18 Hoang Quoc Viet St, Hanoi, Vietnam ' Institute of Physics, Vietnam Academy of Science & Technology, 18 Hoang Quoc Viet St, Hanoi, Vietnam

Abstract: In this paper, we present the calculated and experimental results of the peak-to-background ratio in the XRD patterns of multiwall carbon nanotubes and apply this measure to estimate the concentration of multiwall carbon nanotubes. The estimated results and the reference values for the carbon nanotube concentration are in good agreement.

Keywords: peak-to-background ratio; carbon nanotubes; multiwall CNTs; MWCNTs; X-ray diffraction; purity; nanotechnology; XRD patterns; MWCNT concentration.

DOI: 10.1504/IJNEST.2014.063029

International Journal of Nuclear Energy Science and Technology, 2014 Vol.8 No.3, pp.249 - 259

Received: 02 Jul 2013
Accepted: 24 Jan 2014
Published online: 28 Oct 2014 *

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