Authors: Nguyen Duc Thanh; Phan Hong Khoi; Nguyen Thanh Trung
Addresses: Center for Nuclear Techniques in Ho Chi Minh City (CNT), Vietnam Atomic Energy Commission, 217 Nguyen Trai, Dist. No. 1, Ho Chi Minh City, Vietnam ' Center for High Technology Development, Vietnam Academy of Science & Technology, 18 Hoang Quoc Viet St, Hanoi, Vietnam ' Institute of Physics, Vietnam Academy of Science & Technology, 18 Hoang Quoc Viet St, Hanoi, Vietnam
Abstract: In this paper, we present the calculated and experimental results of the peak-to-background ratio in the XRD patterns of multiwall carbon nanotubes and apply this measure to estimate the concentration of multiwall carbon nanotubes. The estimated results and the reference values for the carbon nanotube concentration are in good agreement.
Keywords: peak-to-background ratio; carbon nanotubes; multiwall CNTs; MWCNTs; X-ray diffraction; purity; nanotechnology; XRD patterns; MWCNT concentration.
International Journal of Nuclear Energy Science and Technology, 2014 Vol.8 No.3, pp.249 - 259
Received: 02 Jul 2013
Accepted: 24 Jan 2014
Published online: 17 Jun 2014 *