Title: Random pattern testability based on critical path tracing

Authors: Che W. Chiou, Ted C. Yang

Addresses: Institute of Electrical and Computer Engineering, National Cheng Kung University, Tainan, Taiwan. ' Department of Information Engineering, Feng Chia University, Taichung, Taiwan

Abstract: A prediction or computation of the fault detection probabilities, FDPs, of all possible faults in a given electronic circuit is very important in the determination of whether the circuit is randomly testable. The two existing approaches for the determination of FDPs have their shortcomings. The first approach, using conventional predictive strategies, fails to approximate the real values and reveal the correct relations between the FDPs of faults. The second approach, using a fault simulator, is very costly in CPU time. In this paper, a new method based on critical path tracing is presented. By adding two counters, it can approximate correct FDPs and reveal the correct relations between faults. In addition, it adds only a little overhead in time. Examples and comparative results are also presented.

Keywords: computer-aided design; CAD; critical path tracing; fault detection probabilities; FDP; random pattern testing.

DOI: 10.1504/IJCAT.1990.062699

International Journal of Computer Applications in Technology, 1990 Vol.3 No.2, pp.88 - 91

Published online: 11 Jun 2014 *

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