Title: Identification of mobility changes induced by deoxyribo nucleic acid in the inversion regions of ultralong single walled carbon nanotube field-effect transistor using support vector machine and multi-layer perceptron
Authors: S.V. Hari Krishna; J.N. An; L.X. Zheng
Addresses: School of Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue 639798, Singapore ' School of Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue 639798, Singapore ' School of Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue 639798, Singapore
Abstract: Using ethanol based chemical vapour deposition (CVD), ultralong single walled carbon nanotubes (SWCNTs) were consistently grown in the centimetre scale, and a number of long-channel carbon nanotube field-effect transistors (CNTFETs) were fabricated. Here, we extracted the field-effect mobility of millimetre-long CNTFETs from the strong inversion region and near-threshold region respectively before and after the addition of deoxyribo nucleic acid (DNA). Support vector machine (SVM) and multi-layer perceptron (MLP) classification algorithms were used to discriminate between the bare device mobility and the DNA induced mobility data in the two regions. SVM classification yielded an average accuracy, sensitivity, and specificity of 97.81%, 97.66%, and 95.38% respectively. On the other hand, MLP based classification resulted in an average accuracy, sensitivity, and specificity of 92.10%, 95.07%, and 90.70%, respectively.
Keywords: carbon nanotubes; CNTs; CNTFETs; ultralong; field-effect transistors; FETs; mobility changes; inversion regions; deoxyribo nucleic acid; DNA; classifiers; support vector machine; SVM; multilayer perceptron; MLP; nanoelectronics; nanotechnology; ethanol; chemical vapour deposition; CVD.
International Journal of Nanotechnology, 2014 Vol.11 No.1/2/3/4, pp.207 - 221
Published online: 14 Mar 2014 *Full-text access for editors Access for subscribers Purchase this article Comment on this article