Title: The metrologic fundamentals of Ultrasonic Echo-Amplitude (UEA) defectometry

Authors: V.F. Davidenko

Addresses: E.O. Paton Electric Welding Institute of NASU, Mezhevaya str,19, app.30, 04123, Kiev, Ukraine

Abstract: The new concept of differential sensitivity of ultrasonic testing was introduced instead of minimum threshold of detection of defects. Moreover, the real defects are replaced by their models in the form of round normal discs, reflecting signals, equivalent to them: amplitude and delay. Process of UEA defectometry takes place in acoustic field of transducer echo-channel. The main its parameters are the field sensitivity (FS) of echo-channel in the form of partial derivative B = ∂q/∂v and three kinds (types) of derivatives from it for each of three independent universal variables of the field (q, u, v), i.e., B₁ = ∂B/∂u, B₂ = ∂B/∂v, B₃ = ∂B/∂q. For FS of echo-signal of each kind their maximums are distinguished and optimum parameters of UEA are determined: position of time window; discreteness of measurement of amplitude of echo-signals and optimum moment for readout of the desired echo-signals in the process of manual scanning.

Keywords: defectometry; differential sensitivity; ultrasonic testing; defect detection; echo-channel; basic parameters; scale sizes; generalised sizes; complex parameters; microstructure; ultrasonic echo amplitude; metrology.

DOI: 10.1504/IJMMP.2013.055384

International Journal of Microstructure and Materials Properties, 2013 Vol.8 No.3, pp.207 - 224

Published online: 02 Jan 2014 *

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