Title: Application of statistical techniques for improving yield of a manufacturing process

Authors: E.V. Gijo; Johny Scaria

Addresses: SQC & OR Unit, Indian Statistical Institute, 8th Mile, Mysore Road, Bangalore – 560059, India ' Department of Statistics, Nirmala College, Muvattupuzha, Kerala – 686661, India

Abstract: This article discusses a case study on yield improvement of a manufacturing process through the application of various statistical techniques. The process was having very high rejection and rework, as the process capability was only 0.10. Various statistical techniques like measurement system analysis, design of experiments with Taguchi method, analysis of variance, dot plot, etc., were used to analyse the data and conclusions were made about the process. As a result of the study, process capability index, Ppk, was improved from 0.10 to 1.05. This has reduced the rejection and rework of the process significantly, which intern helped the organisation to cater to the needs of the customers on time.

Keywords: process capability index; design of experiments; DOE; orthogonal arrays; Taguchi methods; signal to noise ratio; SNR; analysis of variance; ANOVA; main effect plot; yield improvement; manufacturing processes; rejection; rework.

DOI: 10.1504/IJBEX.2013.053616

International Journal of Business Excellence, 2013 Vol.6 No.3, pp.361 - 375

Published online: 09 Apr 2013 *

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