Authors: Salah Haridy; Zhang Wu; John Flaig
Addresses: School of Mechanical and Aerospace Engineering, Nanyang Technological University, 639798, Singapore ' School of Mechanical and Aerospace Engineering, Nanyang Technological University, 639798, Singapore ' Applied Technology, San Jose, CA 95125, USA
Abstract: In recent years, attribute control charts have been increasingly adopted in manufacturing processes and service sectors for monitoring the quality characteristics that cannot be numerically measured. The multiattribute control charts have been proved to be more effective than the simultaneous multiple individual charts for monitoring multiattribute processes. In this paper, a new multiattribute chi-squared (Χ²) chart is proposed to monitor the processes in which more than one type of defects exist on the non-conforming item. Some practical examples are given to illustrate the effectiveness of the new chart in monitoring the multiattribute processes compared with that of the individual p charts and other multiattribute charts.
Keywords: SPC; statistical process control; control charts; chi-squared charts; overall p charts; multiattribute charts; process monitoring.
International Journal of Industrial and Systems Engineering, 2012 Vol.12 No.3, pp.316 - 330
Available online: 03 Oct 2012 *Full-text access for editors Access for subscribers Purchase this article Comment on this article