Title: The effect of machining parameters on surface roughness and material removal rate with cryogenic treated wire in WEDM

Authors: Jatinder Kapoor; Jaimal Singh Khamba; Sehijpal Singh

Addresses: Department of Mechanical Engineering, Guru Nanak Dev Engineering College, Ludhiana-141006, Punjab, India. ' Department of Mechanical Engineering, University College of Engineering, Punjabi University, Patiala-147002, Punjab, India. ' Department of Mechanical Engineering, Guru Nanak Dev Engineering College, Ludhiana-141006, Punjab, India

Abstract: Wire electrical discharge machining (WEDM) has been used widely for the manufacturing of dies, moulds, punches and machine parts. The machining performance is affected by process parameters and type of wire electrode used. Increased cutting speed and improved accuracy can be realised in terms of high performance wire electrodes. The purpose of this study is to investigate the effect of cryogenic treated brass wire electrode on surface roughness and material removal rate for WEDM. This paper describes the influence of various machining parameters (including pulse width, time between two pulses, wire tension and wire feed) on surface roughness and material removal rate by using one variable at a time approach. Improvement in surface roughness was observed for lower values of pulse width and higher values of time between two pulses. Under same conditions, deep and shallow cryogenic treated wire electrodes shows significant improvement in machining rate over untreated wire electrodes.

Keywords: wire EDM; electrical discharge machining; WEDM; surface roughness; machining rate; cryogenic treatment; machining parameters; surface quality; material removal rate; MRR; brass wire electrodes; pulse width; wire tension; wire feed; electro-discharge machining.

DOI: 10.1504/IJMMM.2012.048562

International Journal of Machining and Machinability of Materials, 2012 Vol.12 No.1/2, pp.126 - 141

Published online: 23 Aug 2014 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article