Title: A fractal dimension-based method for statistical process control

Authors: Vijay Shah; David E. Booth

Addresses: Division of Business and Economics, West Virginia University, Parkersburg, WV 26104, USA ' Department of Management and Information Systems, Kent State University, Kent, OH 44242-001, USA

Abstract: For the development of computer-based statistical process control, it would be useful to have an algorithm that performs the work of a Shewhart control chart without actually having to construct such a chart. In this paper, we test the use of fractal dimension, an algorithm to track 'out of control' states and find it to be moderately successful.

Keywords: fractal dimension; outliers; statistical process control; SPC; control charts.

DOI: 10.1504/IJOR.2012.046647

International Journal of Operational Research, 2012 Vol.14 No.2, pp.187 - 199

Published online: 13 Apr 2012 *

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