Title: Change point analysis and assessment: an integrated methodological design

Authors: Sabine Mueller; Helle Neergaard; John P. Ulhoi

Addresses: Centre for Organizational Renewal and Evolution, Aarhus School of Business, Aarhus University, Haslegaardsvej 10, DK-8210 Aarhus V, Denmark. ' Centre for Organizational Renewal and Evolution, Aarhus School of Business, Aarhus University, Haslegaardsvej 10, DK-8210 Aarhus V, Denmark. ' Centre for Organizational Renewal and Evolution, Aarhus School of Business, Aarhus University, Haslegaardsvej 10, DK-8210 Aarhus V, Denmark

Abstract: The aim of this article is to develop an analytical framework for studying processes such as continuous innovation and business development in high-tech SME clusters that transcends the traditional qualitative-quantitative divide. The article|s key contribution is the conceptual integration of four existing and well-recognised but separate approaches to studying events, processes, and change, namely change-point analysis (CPA), event-history analysis (EHA), critical-incident technique (CIT), and sequence analysis (SA) into a single design framework which is especially useful for studying complex and long-term or ongoing processes.

Keywords: changepoint analysis; change-point analysis; change-point assessment; changepoint assessment; CPAA; integrated methodological designs; quantitative data; qualitative data; high-tech SMEs; SME clusters; cluster analysis; small and medium-sized enterprises; analytical frameworks; continuous innovation; business development; high technologies; event-history analysis; CIT; critical incident technique; sequence analysis; design frameworks; complex processes; long-term processes; ongoing processes; innovation management; technology management; innovation enhancement; innovation environments.

DOI: 10.1504/IJTM.2011.042983

International Journal of Technology Management, 2011 Vol.56 No.2/3/4, pp.208 - 224

Available online: 11 Oct 2011 *

Full-text access for editors Access for subscribers Purchase this article Comment on this article