Title: Specific ploughing energy model using single grit scratch test

Authors: Vijayender Singh, U.S. Patnaik Durgumahanti, P. Venkateswara Rao, S. Ghosh

Addresses: Mechanical Engineering Department, Indian Institute of Technology Delhi, Hauz Khas New Delhi 110016, India. ' Mechanical Engineering Department, Indian Institute of Technology Delhi, Hauz Khas New Delhi 110016, India. ' Mechanical Engineering Department, Indian Institute of Technology Delhi, Hauz Khas New Delhi 110016, India. ' Mechanical Engineering Department, Indian Institute of Technology Delhi, Hauz Khas New Delhi 110016, India

Abstract: Model of specific ploughing energy is developed in mild steel using single grit scratch tests. The effects of the four grinding process parameters, i.e., grinding speed, table speed, grain size and depth of cut on specific ploughing energy are investigated. To model the specific ploughing energy, the geometrical parameters of the groove produced during single grit scratch test have been measured using Talysurf profilograms. Specific ploughing energy, scratch hardness, geometrical height ratio and geometrical radius ratio are mathematically modelled in terms of the grinding process variables. It has been observed that the grain size and depth of cut have significant effect on the ploughing phenomenon. Specific ploughing energy has been seen to be a significant component of the total specific grinding energy. This component has become even more predominant at very low depth of cut. Predominance of specific ploughing energy at low depth of cut has helped to explain the |size effect| phenomena in grinding. This has enhanced the knowledge of ploughing phenomena with respect to process parameters and material properties of the workpiece.

Keywords: specific ploughing energy; single grit scratch tests; profilograms; scratch hardness; pile up height; mathematical modelling; mild steel; grinding speed; table speed; grain size; depth of cut; grinding energy.

DOI: 10.1504/IJAT.2011.041609

International Journal of Abrasive Technology, 2011 Vol.4 No.2, pp.156 - 173

Received: 04 Oct 2010
Accepted: 14 Mar 2011

Published online: 27 Sep 2014 *

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