Authors: Qin Hong, Justin R. Chimka
Addresses: Department of Industrial Engineering, University of Arkansas, Fayetteville, AR 72701, USA. ' Department of Industrial Engineering, University of Arkansas, Fayetteville, AR 72701, USA
Abstract: In this article we introduce a demerit system for generally m defect classes based on the assumption that total demerits has the binomial distribution. Then we derive general expressions for error probabilities Type I and Type II that would make possible economic design. We assume the binomial distribution assumption is reasonable for medication error severity data, and our new demerit system seems to provide an appropriate monitor.
Keywords: adverse drug events; binomial distribution; demerits; medication errors; ordinal variables; distributed defects; medication error severity; in-hospital preventable ADE; healthcare management.
International Journal of Quality Engineering and Technology, 2010 Vol.1 No.4, pp.427 - 440
Available online: 30 Sep 2010 *Full-text access for editors Access for subscribers Purchase this article Comment on this article