Authors: Robert P. Fisk, S.M. Rezaul Hasan
Addresses: Center for Research in Analog and VLSI microsystem dEsign (CRAVE), School of Engineering and Advanced Technology, Massey University, Auckland, New Zealand. ' Center for Research in Analog and VLSI microsystem dEsign (CRAVE), School of Engineering and Advanced Technology, Massey University, Auckland, New Zealand
Abstract: This paper presents a comparison of incremental delta-sigma analogue-to-digital converters for integrated temperature sensing applications. The characteristics of bipolar transistor-based temperature sensing front-ends place specific requirements on the modulator loop architecture. Single loop delta-sigma architecture that removes the input signal from the internal loop by the addition of a feedforward path to the quantiser has been investigated thoroughly. It is found that the Noise Transfer Function (NTF) implemented by the modulator can be optimised for either accuracy or integrator signal excursion, based on the requirements of the target application.
Keywords: temperature sensors; PTAT; CMOS technology; incremental delta-sigma modulators; analog-to-digital converters; noise transfer function.
International Journal of Computer Applications in Technology, 2010 Vol.39 No.1/2/3, pp.66 - 71
Published online: 18 Aug 2010 *Full-text access for editors Access for subscribers Purchase this article Comment on this article