Title: Developing a self-assessment model for measuring new product development performance: an AHP approach

Authors: Kit Fai Pun, Man Yin Rebecca Yiu, Kwai Sang Chin

Addresses: Department of Mechanical and Manufacturing Engineering, Faculty of Engineering, The University of the West Indies, St Augustine Campus, West Indies, Trinidad and Tobago. ' Department of Mechanical and Manufacturing Engineering, Faculty of Engineering, The University of the West Indies, St Augustine Campus, West Indies, Trinidad and Tobago. ' Department of Manufacturing Engineering and Engineering Management, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong

Abstract: This paper identified a list of twenty-one elements under seven performance criteria as advocated in literature that affect new product development (NPD) practices and performance in industry. Incorporating the findings of interviews with industry practitioners and experts in Hong Kong, a generic self-assessment model of NPD performance was developed using the analytic hierarchy process (AHP) methodology. It was found that |results orientation|, |customer focus| and |strategy| constituted to the most important criteria. With the aid of the HP software, the collected data was analysed, and the relative importance of performance criteria and elements was computed. The point values for scoring criteria and sub-elements of model were devised using the normalised weights of empirical findings obtained from the AHP analysis. This paper contributes to identifying the performance criteria and developing the assessment model for managing NPD in industry. Further research is needed to investigate the applicability of the self-assessment model.

Keywords: performance measurement; self-assessment models; success factors; performance criteria; new product development; NPD performance; analytical hierarchy process; AHP.

DOI: 10.1504/IJAOM.2010.034586

International Journal of Advanced Operations Management, 2010 Vol.2 No.1/2, pp.57 - 79

Published online: 10 Aug 2010 *

Full-text access for editors Access for subscribers Purchase this article Comment on this article