Title: Determination of residual strain by combining EBSD and DIC techniques

Authors: Jui-Chao Kuo, Han-Hong Wang

Addresses: Department of Materials Science and Engineering, National Cheng-Kung University, No.1, University Road, Tainan 701, Taiwan, ROC. ' Department of Materials Science and Engineering, National Cheng-Kung University, No.1, University Road, Tainan 701, Taiwan, ROC

Abstract: Electron Back-Scatter Diffraction (EBSD) can be applied to determine lattice defect and local strain distortion. The strain components were obtained with the help of the shifting of zone axis in Kikuchi patterns generated from EBSD. The displacement of zone axis in Kikuchi pattern was determined by using Digital Image Correlation (DIC) method, which provides a great resolution down to 0.01 pixels, which means the ideal sensitivity to be ∼3.6 × 10−5. However, the errors of calculating the residual strain can result from the image quality of Kikuchi patterns, such as the formation of dark areas in the Kikuchi patterns and the background noise.

Keywords: residual strain; electron diffraction; EBSD; electron back-scatter diffraction; DIC; digital image correlation; lattice defects; local strain distortion; zone axis; Kikuchi patterns.

DOI: 10.1504/IJMPT.2010.031432

International Journal of Materials and Product Technology, 2010 Vol.37 No.3/4, pp.328 - 337

Published online: 03 Feb 2010 *

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