Authors: Kunwar Bahadur Singh, R.K. Saket, S. Chatterji
Addresses: Department of Electrical Engineering, National Institute of Technical Teachers Training and Research, Sector 26, Chandigarh 160019, India. ' Department of Electrical Engineering, Institute of Technology, Banaras Hindu University, Varanasi, Uttar Pradesh, India. ' Department of Electrical Engineering, National Institute of Technical Teachers Training and Research, Sector 26, Chandigarh 160019, India
Abstract: Derating affects heavily the component selection and the thermal design of products. Therefore, it would be expected that this procedure is well motivated and that the de-rated temperature is selected so that the component after derating meets the reliability requirements, but on the other hand, the derating should not add too large safety margins. Too large safety margins may easily result in unnecessary and expensive cooling arrangements. In this paper, the effect of using linear derating guidelines on lifetime is discussed and an alternative derating approach, that takes better into account the temperature dependency of the lifetime, is introduced. The effect of parameter uncertainties on lifetime prediction is also explained. Finally, a new derating procedure that uses a physical lifetime model and compensates for the parameter uncertainty is proposed.
Keywords: temperature derating; linear derating; lifetime prediction; activation energy; derating factors; life modelling; parameter uncertainty; UCL; upper confidence limit; integrated circuits; FIT; failure in time; reliability; component selection; thermal design; product design.
International Journal of Reliability and Safety, 2010 Vol.4 No.1, pp.89 - 103
Available online: 30 Nov 2009 *Full-text access for editors Access for subscribers Purchase this article Comment on this article