Title: Reducing test costs in electronics mass-production

Authors: Jukka Antila, Timo Karhu, Matti Mottonen, Janne Harkonen, Pekka Belt

Addresses: Nokia Siemens Networks, P.O. Box 319, FI-90651 Oulu, Finland. ' Nokia Siemens Networks, P.O. Box 319, FI-90651 Oulu, Finland. ' Department of Industrial Engineering and Management, University of Oulu, Finland, P.O. Box 4610, FI-90014 University of Oulu, Finland. ' Department of Industrial Engineering and Management, University of Oulu, Finland, P.O. Box 4610, FI-90014 University of Oulu, Finland. ' Department of Industrial Engineering and Management, University of Oulu, Finland, P.O. Box 4610, FI-90014 University of Oulu, Finland

Abstract: This paper studies the simultaneous optimisation of quality and costs in mass-production of complex electronics products. Testing has become a critical bottleneck for assuring quality, requiring a large amount of time and resources. The volume of especially functional testing must be minimised to reduce costs. Sampling is a potential way to obtain this. Unfortunately, existing sampling methods are not functional in the modern electronics environment with multiple tests. This paper presents new efficient methods, based on continuous sampling plan (CSP) procedures. The applicability of the developed methods is confirmed empirically by analysing and simulating real industrial data.

Keywords: testing; simulation; standards; continuous sampling plan; CSP; electronics mass-production; manufacturing; services; test costs.

DOI: 10.1504/IJSS.2008.020055

International Journal of Services and Standards, 2008 Vol.4 No.4, pp.393 - 406

Published online: 22 Aug 2008 *

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