Title: The Canadian Centre for Electron Microscopy: a national facility for ultrahigh resolution electron microscopy
Authors: Gianluigi A. Botton
Addresses: Canadian Centre for Electron Microscopy, Department of Materials Science and Engineering, Brockhouse Institute for Materials Research, McMaster University, 1280 Main Street West, Hamilton, ONT, L8S 4M1, Canada
Abstract: The Canadian Centre for Electron Microscopy is described and the facilities available to Canadian researchers and international collaborators are presented. The facility offers aberration-corrected transmission electron microscopy instrumentation, conventional transmission electron microscopes, scanning electron microscopes and a suite of sample preparation facilities. The advantages and benefits of aberration corrected microscopy are described and applications of this technique in materials science are discussed. Examples of applications of the current instrumentation and the improvements in spectroscopic capabilities are presented. For the benefit of users of the facility, the technical configurations of the instruments, the environment, the mode of operation of the Centre as well as the governing structure are presented.
Keywords: Canadian Centre for Electron Microscopy; facilities; nanoscale materials; nanotechnology; Canada; electron energy loss spectroscopy; ultra-high resolution microscopy; aberration-corrected electron microscopy.
International Journal of Nanotechnology, 2008 Vol.5 No.9/10/11/12, pp.1082 - 1093
Published online: 09 Aug 2008 *Full-text access for editors Access for subscribers Purchase this article Comment on this article