Title: Components of disaster-tolerant computing: analysis of disaster recovery, IT application downtime and executive visibility
Authors: Chad M. Lawler, Michael A. Harper, Stephen A. Szygenda, Mitchell A. Thornton
Addresses: Capgemini America, 200 West John Carpenter, Freeway, Irving TX 75063, USA. ' Critical Infrastructure Protection Center, SPAWAR Systems Center Charleston, Department of the Navy, North Charleston, SC 29419, USA. ' Engineering Management, Information and Systems Department, Southern Methodist University, Dallas, TX 75275, USA. ' Department of Computer Science and Engineering, Southern Methodist University, Dallas, TX 75275, USA
Abstract: This paper provides a review of disaster-tolerant Information Technology (IT). The state of traditional disaster recovery approaches is outlined. The risks of IT application downtime attributable to the increasing dependence on critical information technology operating in interdependent, interacting complex infrastructure systems are reviewed. General disaster tolerance techniques are summarised. While content-specific approaches currently undertaken to understand and avoid cascading failures in systems are extant, opportunities exist to extend this complex systems independence analysis to the private business sector in the form of disaster tolerance. The high level of complexity of relationships between IT application availability and numerous secondary and tertiary effects of a disaster on systems that are dependent on other systems for availability has not yet been fully explored.
Keywords: disaster tolerance; criticality-driven; interdependent; interaction; complex infrastructure systems; survivability; IT application downtime; disaster recovery; business continuity; information technology; disaster-tolerant computing; executive visibility; IT application availability; emergency management.
International Journal of Business Information Systems, 2008 Vol.3 No.3, pp.317 - 331
Available online: 22 Feb 2008 *Full-text access for editors Access for subscribers Purchase this article Comment on this article