Title: Simulation on the mechanical behaviour of polyetheretherketone material under different loading conditions

Authors: Ruoxun Fan; Jie Liu; Huajie Wu; Zhengbin Jia

Addresses: Department of Traffic Engineering, Yangzhou Polytechnic Institute, Yangzhou, 225127, China ' Department of Traffic Engineering, Yangzhou Polytechnic Institute, Yangzhou, 225127, China ' Department of Traffic Engineering, Yangzhou Polytechnic Institute, Yangzhou, 225127, China ' School of Biological Science and Medical Engineering, Beihang University, Beijing 100191, China

Abstract: Given the increasing demand for lightweight materials, polyetheretherketone (PEEK) is gaining attention as a potential alternative to metals. To evaluate its mechanical suitability for engineering applications, it is necessary to predict the elastic, plastic, and fracture behaviour of PEEK under common loading conditions. The tensile, compressive, and three-point bending experiments were conducted on the PEEK specimens in this study. The yield and failure strains of PEEK were 2.27% and 4.69% in tension and 3.88% and 5.79% in compression. Based on the continuum damage mechanics, the back-calculation analyses were performed to predict the damage variable expression. Subsequently, a simulation model for PEEK under different loading conditions was developed. The back-calculation results identified optimal damage variable yield index (Dy) values of 0.295 for tension and 0.465 for compression. These findings validated the feasibility and applicability of the proposed model, providing a foundation for further investigations into the mechanical properties of PEEK material.

Keywords: polyetheretherketone; PEEK; tension; compression; three-point bending; simulation model; continuum damage mechanics; damage variable expression; damage variable yield index; back-calculation.

DOI: 10.1504/IJMPT.2026.151503

International Journal of Materials and Product Technology, 2026 Vol.70 No.3, pp.296 - 310

Received: 06 Jan 2025
Accepted: 17 Sep 2025

Published online: 03 Feb 2026 *

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