Title: Transforms for cause-selecting control chart for a bivariate high-sigma process
Authors: S. Lakshminarasimhan, S.M. Kannan
Addresses: TVS Sewing Needles Limited, Madurai – 625016, India. ' Department of Mechanical Engineering, Thiagarajar College of Engineering, Madurai – 625015, India
Abstract: When two production processes are interdependent, cause-selecting control charts are used to detect the variations in the succeeding process on account of the preceding process. In current literature, these charts are discussed for three-sigma process quality monitoring. In high-sigma processes that operate above three-sigma, the defect counts are in the order of parts per million. The traditional charts are obsolete for monitoring such processes. Count of conforming items between two non-conforming items is being used as data for the high-sigma process control charts. The underlying distribution is geometric distribution. Transforms are being used to convert the data to normality. In this work, a new transform is proposed for residual-type, cause-selecting control charts for a bivariate high-sigma process.
Keywords: cause-selecting control charts; high sigma; residuals control charts; regression line; transforms; six sigma.
DOI: 10.1504/IJSSCA.2007.015069
International Journal of Six Sigma and Competitive Advantage, 2007 Vol.3 No.3, pp.266 - 281
Published online: 09 Sep 2007 *
Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article