Title: Examining the antecedents of deep safety compliance and surface safety compliance: an expanding of technology acceptance model

Authors: Ho Y. Hiep; Nguyen Ngoc Hien

Addresses: Faculty of Business Administration, Industrial University of Ho Chi Minh City, Ho Chi Minh City, Vietnam ' Faculty of Business Administration, Industrial University of Ho Chi Minh City, Ho Chi Minh City, Vietnam

Abstract: This study examines the antecedents of deep safety compliance and surface safety compliance among garment and footwear workers in Vietnam. The study expands on the technology acceptance model by incorporating social cognitive theory to investigate the influence of participative management and co-worker support on perceived usefulness, perceived ease of use and self-efficacy, ultimately impacting deep safety compliance and surface safety compliance. Data from a survey of 549 workers in five garment and footwear enterprises in Vietnam was analysed using partial least squares structural equation modelling. Findings revealed that both participative management and co-worker support significantly enhance perceived usefulness, perceived ease of use of safety procedures and worker self-efficacy. These perceptions, in turn, positively influence deep safety compliance and negatively impact surface safety compliance. This research adds a novel finding to the technology acceptance model by demonstrating the significant influence of participative management and co-worker support on safety compliance, expanding its applicability in the safety domain. Other literature contributions and practical implications for enhancing workplace safety are also discussed.

Keywords: deep safety compliance; surface safety compliance; self-efficacy; participative management; co-worker support.

DOI: 10.1504/IJRS.2025.149323

International Journal of Reliability and Safety, 2025 Vol.19 No.4, pp.394 - 416

Received: 25 Aug 2024
Accepted: 28 Mar 2025
Published online: 24 Oct 2025 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article