Title: Psychophysiological state recognition of middle school students based on vibraimage technology and k-means cluster analysis algorithm
Authors: Rui Huang; Xiaoquan Liu; Yunzhen Xue; Zhu Zhang
Addresses: School of Psychology and Mental Health, North China University of Science and Technology, China; Shanxi Hongmao Technology Service Co., Ltd., Taiyuan City, Shanxi Province, 030032, China ' School of Humanities and Social Science, Shanxi University of Chinese Medicine, China ' School of Humanities and Social Science, Shanxi Medical University, China ' Shanxi Hongmao Technology Service Co., Ltd., Taiyuan City, Shanxi Province, 030032, China
Abstract: Adolescence is a special period for middle school students to have rebellious psychology. How to effectively evaluate the mental health of middle school students and help middle school students successfully pass adolescence has always been the focus and difficulty of psychologists' research. The typical emotion recognition of middle school students in adolescence is the basis for completing this work. In order to identify the psychological and physiological state of middle school students in adolescence, this paper proposes a method of adolescent psychological and physiological state recognition based on vibration imaging technology-K-means clustering analysis algorithm. In order to verify the feasibility of this method, 74,011 middle school students from 59 schools in Taiyuan City were selected as experimental subjects, and the experimental data were obtained by face-to-face interviews and capturing the facial expression video stream of the interviewees. The research results show that the vibration imaging technology-K-means clustering combination model is feasible for the identification of the psychological and physiological state of middle school students in adolescence, and has certain reference significance for the research work in this field.
Keywords: K-means clustering; vibration imaging technology; descriptive statistical analysis; adolescence.
International Journal of Embedded Systems, 2024 Vol.17 No.1/2, pp.12 - 23
Received: 21 Nov 2023
Accepted: 07 Jan 2024
Published online: 06 Jan 2025 *