Title: Wide and fault diameter in Kneser graphs for enhanced fault tolerance in parallel computing

Authors: R. Sundara Rajan; G. Kirithiga Nandini; Yuqing Lin; Remi Mariam Reji

Addresses: Department of Mathematics, Hindustan Institute of Technology and Science, Chennai, 603 103, India ' Department of Computer Science and Engineering, Hindustan Institute of Technology and Science, Chennai, 603 103, India ' School of Electrical Engineering and Computing, The University of Newcastle, Callaghan, NSW, 2308, Australia ' Department of Mathematics, Christian College, Chengannur, Kerala, 689 122, India

Abstract: A system's fault tolerance is its capacity to function even if one or more of its components fail. Implementing a fault-tolerant network becomes an important criterion for reliable computing. Reliability measures play a significant part in recognising the role of faulty and non-faulty processors in a parallel computing system. Parallel computing is used primarily for saving time, solving big problems, and doing multiple tasks at once at the same time. Various reliability measures have been introduced to evaluate a network's fault-tolerance capability. We have measured the wide diameter and fault diameter of the Kneser graphs in this study. Also, we have verified the fault diameter obtained using an experimental study. Further, we have described some applications of wide diameter and fault diameter in parallel and distributed computing.

Keywords: Kneser graph; connectivity; fault tolerance; wide diameter; fault diameter.

DOI: 10.1504/IJNVO.2024.143320

International Journal of Networking and Virtual Organisations, 2024 Vol.31 No.3, pp.169 - 190

Received: 02 May 2024
Accepted: 27 Aug 2024
Published online: 13 Dec 2024 *

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