Title: High-fidelity modelling of multiple transporters block transportation based on digital twin at shipyards

Authors: Tian Luo; Zhenyu Xu; Xin Song; Miaomiao Sun

Addresses: School of Economics and Management, Shanghai Maritime University, Shanghai, 201306, China ' Institute of Logistics Science and Engineering, Shanghai Maritime University, Shanghai, 201306, China ' School of Economics and Management, Shanghai Maritime University, Shanghai, 201306, China ' Institute of Logistics Science and Engineering, Shanghai Maritime University, Shanghai, 201306, China

Abstract: In order to solve the problems of poor scheduling and inefficiency of transporters in block transportation at shipyard, this paper proposed a framework of multiple transporters for block transportation scheduling systems with a digital twin-based (DT) five-dimensional model. The proposed framework can be used to identify low-efficiency of multidisciplinary, multi-physics, multiscale, and dynamic changes over time at shipyards to optimise the efficiency of multiple transporter scheduling and block transportation. DT provides the fidelity required to realistically predict transporter scheduling schemes with rescheduling actions under various interference conditions. The high-fidelity model is investigated using three levels of geometry, dynamics and data. An optimal simulation model experiment with multiple transporters is adopted to improve transportation efficiency. The results show that the proposed DT framework and high-fidelity model are effective, and both the utilisation of transporters and the transportation efficiency of blocks are improved.

Keywords: high-fidelity modelling; simulation; block transportation; multiple transporters transportation; digital twin; DT.

DOI: 10.1504/IJIMS.2024.140228

International Journal of Internet Manufacturing and Services, 2024 Vol.10 No.2/3, pp.165 - 188

Received: 02 Sep 2022
Accepted: 01 Nov 2022

Published online: 31 Jul 2024 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article