Title: Application of a coupled electromagnetic-thermal model for 2D analysis of thermal runaway

Authors: P. Plaza-Gonzalez, J. Monzo-Cabrera, J.M. Catala-Civera, J. Escalante-Matas, J. Pitarch-Portero

Addresses: Department of Communications, Technical University of Valencia, Camino de los Naranjos s/n, E-43026 Valencia, Spain. ' Department of Information Technologies and Communications, Technical University of Cartagena, Campus Muralla del Mar s/n, E-30.202 Cartagena, Murcia, Spain. ' Department of Communications, Technical University of Valencia, Camino de los Naranjos s/n, E-43026 Valencia, Spain. ' Department of Information Technologies and Communications, Technical University of Cartagena, Campus Muralla del Mar s/n, E-30.202 Cartagena, Murcia, Spain. ' Department of Communications, Technical University of Valencia, Camino de los Naranjos s/n, E-43026 Valencia, Spain

Abstract: In this work, a coupled electromagnetic and thermal physical model has been implemented in order to analyse the thermal runaway development during the application of microwave energy. Both static and mode-stirred microwave ovens have been analysed and its influence on the electric field and temperature patterns compared. Additionally, the continuous and pulsed uses of the microwave power source are also compared. Results indicate that temperature permittivity dependence, thermal conductivity and the electric field deposition are mainly responsible for thermal avalanche and |hot spot| development.

Keywords: dielectric heating; dielectric properties; microwave heating; microwave industrial ovens; thermal runaway; electromagnetic modelling; thermal modelling.

DOI: 10.1504/IJMPT.2007.013135

International Journal of Materials and Product Technology, 2007 Vol.29 No.1/2/3/4, pp.163 - 184

Published online: 09 Apr 2007 *

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