Title: Testing effort based SRGM and release decision under fuzzy environment

Authors: Palak Saxena; Naveen Singh; Avinash K. Shrivastava; Vijay Kumar

Addresses: Department of Mathematics, Amity Institute of Applied Sciences, Amity University Uttar Pradesh, Noida, India ' Advanced Analytics at IQVIA, Cessana Techpark, Bangalore, Karnataka, India ' Management Information Systems and Analytics, International Management Institute, Kolkata, West Bengal, India ' Department of Mathematics, Amity Institute of Applied Sciences, Amity University Uttar Pradesh, Noida, India

Abstract: Software reliability is an important measure of software quality and is described by a mathematical model known as the software reliability growth model (SRGM). Several SRGMs have been developed for software engineers and testers to evaluate software reliability, remaining number of faults, and testing release time. In this study, we have proposed testing effort based software reliability growth models (SRGMs) with Generalised Modified Weibull (GMW) distribution under fuzzy environment. During the testing process, it is likely that new faults are added known as error generation or the rate of error detection is poor due to a low degree of skilled technique known as imperfect debugging. Further, we have incorporated time dependent rate function in our model and have calculated model parameter using Statistical Package for Social Sciences (SPSS). Moreover, we have also discussed the release time of the software using SRGM and optimum value of reliability of the software under uncertainty in parameters. Numerical illustration on a real life data set is done to validate the results.

Keywords: SRGMs; fuzzy set theory; testing; software reliability; cost; release time.

DOI: 10.1504/IJRS.2021.123275

International Journal of Reliability and Safety, 2021 Vol.15 No.3, pp.123 - 140

Received: 18 Mar 2021
Accepted: 13 Oct 2021

Published online: 07 Jun 2022 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article