Title: Design of fault tolerant majority voter for error resilient TMR targeting micro to nano scale logic

Authors: Mrinal Goswami; Subrata Chattopadhyay; Shiv Bhushan Tripathi; Bibhash Sen

Addresses: Department of Computer Science and Engineering, National Institute of Technology, Durgapur, West Bengal, India ' Department of Computer Science and Engineering, National Institute of Technology, Durgapur, West Bengal, India ' Department of Computer Science and Engineering, National Institute of Technology, Durgapur, West Bengal, India ' Department of Computer Science and Engineering, National Institute of Technology, Durgapur, West Bengal, India

Abstract: The shrinking size of transistors for satisfying the increasing demand for higher density and low power has made the VLSI circuits more vulnerable to faults. Therefore, new circuits in advanced VLSI technology have forced designers to use fault tolerant techniques in safety-critical applications. Also, the presence of some faults (not permanent) due to the complexity of the nanocircuit or its interaction with software results in malfunctioning of circuits. The fault tolerant scheme, where majority voter plays the core role in triple modular redundancy (TMR), is being implemented increasingly in digital systems. This work targets to implement a different fault tolerant scheme of majority voter for the implementation of TMR using quantum-dot cellular automata (QCA), viable alternative nanotechnology to CMOS VLSI. The fault masking ability of various voter designs has been analysed in details. The fault masking ratio of the proposed voter (FMV) is 66% considering single/multiple faults. Simulation results establish the validation of proposed logic in QCA which targets nano-scale devices. The proposed logic is also suitable for conventional CMOS technology, which is verified with the Cadence tool.

Keywords: quantum dot cellular automata; QCA; triple modular redundancy; TMR; fault tolerant majority voter; FMV; QCA defects; reliability; nanoelectronics.

DOI: 10.1504/IJCSE.2020.106062

International Journal of Computational Science and Engineering, 2020 Vol.21 No.3, pp.375 - 393

Received: 26 Sep 2018
Accepted: 15 Nov 2018
Published online: 27 Mar 2020 *

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