Title: Improvement of the wire compensation configuration model for improving part accuracy in cylindrical wire electrical discharge turning

Authors: R. Izamshah; M. Akmal; M. Shahir Kasim

Addresses: Precision Machining Group, Faculty of Manufacturing Engineering, Universiti Teknikal Malaysia Melaka, 76100 Durian Tunggal, Melaka, Malaysia ' Faculty of Manufacturing Engineering, Universiti Teknikal Malaysia Melaka, 76100 Durian Tunggal, Melaka, Malaysia ' Precision Machining Group, Faculty of Manufacturing Engineering, Universiti Teknikal Malaysia Melaka, 76100 Durian Tunggal, Melaka, Malaysia

Abstract: Demand for complex micro-sized shape components has driven the industries on the development of a new machine and fabrication technique. One of the latest techniques is by combining a sparking electrode wire with a rotating workpiece, known as cylindrical wire electrical discharge turning (CWEDT). However, owing to the uncontrolled discharge energy, the existence of dynamic run-out and valid wire positioning compensation estimations in the CWEDT process affect its capability of producing micro-sized components. This paper proposes a new compensation configuration model for the CWEDT process that aims to improve the dimensional accuracy. The developed configuration model emphasises the way to obtain the desired diameter that can be used as the input value for positioning the electrode wire through a machine system. Sets of experimental runs were performed to confirm its validity. Analytical results show that the developed model has improved the part accuracy up to 95% and is capable of eliminating overcut error, hence, verifying its validity.

Keywords: cylindrical wire electrical discharge turning; CWEDT; tool compensation; dimensional accuracy; microfabrication; WEDT; EDM; WEDM; cutting strategy.

DOI: 10.1504/IJMTM.2019.104548

International Journal of Manufacturing Technology and Management, 2019 Vol.33 No.6, pp.428 - 445

Received: 07 Sep 2016
Accepted: 15 Mar 2017
Published online: 20 Jan 2020 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article