Authors: Leona Tamaru; Hideki Nagatsuka
Addresses: Graduate School of Science and Engineering, Chuo University, Tokyo, Japan ' Department of Industrial and Systems Engineering, Chuo University, Tokyo, Japan
Abstract: A stochastic degradation model based on the generalised inverse Gaussian (GIG) distribution is provided. The proposed model can be seen a generalisation of the prominent existing degradation models in a sense, under the mild conditions, and it might be more flexible than the existing ones. The maximum likelihood estimation of the proposed model is also developed. Two case applications are performed to demonstrate the advantages of the proposed model, based on the well-known real degradation data sets of the GaAs laser devices and crack sizes of specimens.
Keywords: degradation model; generalised inverse Gaussian distribution; inverse Gaussian distribution; gamma distribution; maximum likelihood estimation; Akaike information criterion; Kolmogorov-Smirnov statistics.
Asian Journal of Management Science and Applications, 2019 Vol.4 No.1, pp.49 - 58
Available online: 01 Aug 2019 *Full-text access for editors Access for subscribers Purchase this article Comment on this article