Title: Model validation of double phase fault in pentagon connected FPIM through simulation and experimentation

Authors: Jahera Shaik; R. Chudamani

Addresses: Electrical Engineering Department, Sardar Vallabhbhai National Institute of Technology, Surat, Gujarat, 395007, India ' Electrical Engineering Department, Sardar Vallabhbhai National Institute of Technology, Surat, Gujarat, 395007, India

Abstract: This research article dispenses a simulation validation as well as an experimental validation to a mathematical procedure proposed to model a double phase fault (DPF) in a five-phase induction machine (FPIM) operating in stator configurations specifically for pentagon. This proactive methodology makes it possible to test the machinery in a non-destructive way. This mathematical procedure involves the computation of the voltages across the open circuited phases in a double phase fault. The multi-phase induction machines present numerous advantages in comparison to their three-phase counterparts, such as reduced torque ripple, fault-tolerant capability etc. In this work, one of these features, fault-tolerant capability which makes multi-phase systems more approachable, is explicated under a defined scenario i.e., double phase fault. A double phase open circuited condition has two possibilities, adjacent double phase fault (ADPF) and non-adjacent double phase fault (NADPF). To begin with, a steady state model of FPIM operating under DPF is developed in stationary reference frame. The mathematical model using this approach is simulated in MATLAB/Simulink® and the results are exhaustively discussed. Further, the proposed model is experimentally verified using a laboratory prototype of 1.5 HP FPIM using dSPACE DS1104 and the results obtained are in concordance with those of simulation results.

Keywords: five phase induction machine; pentagon connection; adjacent and non-adjacent double phase fault; model validation; torque ripple; fault current analysis.

DOI: 10.1504/IJPELEC.2026.153508

International Journal of Power Electronics, 2026 Vol.22 No.3, pp.235 - 264

Received: 12 Nov 2024
Accepted: 17 Apr 2025
Published online: 12 May 2026 *

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