An ontology-based method for improving the quality of process event logs using database bin logs
by Shokoufeh Ghalibafan; Behshid Behkamal; Mohsen Kahani; Mohammad Allahbakhsh
International Journal of Metadata, Semantics and Ontologies (IJMSO), Vol. 14, No. 4, 2020

Abstract: The main goal of process mining is discovering models from event logs. The usefulness of these discovered models is directly related to the quality of event logs. Researchers proposed various solutions to detect deficiencies and improve the quality of event logs; however, only a few have considered the application of a reliable external source for the improvement of the quality of event data. In this paper, we propose a method to repair the event log using the database bin log. We show that database operations can be employed to overcome the inadequacies of the event logs, including incorrect and missing data. To this end, we, first, extract an ontology from each of the event logs and the bin log. Then, we match the extracted ontologies and remove inadequacies from the event log. The results show the stability of our proposed model and its superiority over related works.

Online publication date: Wed, 02-Jun-2021

The full text of this article is only available to individual subscribers or to users at subscribing institutions.

 
Existing subscribers:
Go to Inderscience Online Journals to access the Full Text of this article.

Pay per view:
If you are not a subscriber and you just want to read the full contents of this article, buy online access here.

Complimentary Subscribers, Editors or Members of the Editorial Board of the International Journal of Metadata, Semantics and Ontologies (IJMSO):
Login with your Inderscience username and password:

    Username:        Password:         

Forgotten your password?


Want to subscribe?
A subscription gives you complete access to all articles in the current issue, as well as to all articles in the previous three years (where applicable). See our Orders page to subscribe.

If you still need assistance, please email subs@inderscience.com