Int. J. of Nanotechnology   »   2004 Vol.1, No.1/2



Title: Synchrotron radiation, soft-X-ray spectroscopy and nanomaterials


Author: Jinghua Guo


Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA


Abstract: Both synchrotron radiation based soft-X-ray absorption spectroscopy (XAS) and resonant soft-X-ray emission spectroscopy (XES) on a variety of nano-structured systems has yielded characteristic fingerprints. With high-resolution monochromatized synchrotron radiation excitation, resonant inelastic X-ray scattering (RIXS) has emerged as a new source of information about electronic structure and excitation dynamics of nanomaterials. The selectivity of the excitation, in terms of energy and polarization, has also facilitated studies of emission anisotropy. Various features observed in resonant emission spectra have been identified and studied.


Keywords: synchrotron radiation; soft-X-ray absorption; soft-X-ray emission spectroscopy; electronic structure; nanomaterials; nanotechnology.


DOI: 10.1504/IJNT.2004.003729


Int. J. of Nanotechnology, 2004 Vol.1, No.1/2, pp.193 - 225


Available online: 22 Dec 2003



Editors Full text accessAccess for SubscribersPurchase this articleComment on this article