Title: Reliability analysis of programmable mechatronics system using Bayesian approach

Authors: R. Amuthakkannan, S.M. Kannan, K. Vijayalakshmi, N. Ramaraj

Addresses: Mechatronics and Virtual Instrumentation Research cell, Department of Mechanical Engineering, Coimbatore Institute of Technology, Coimbatore-641 014, Tamil Nadu, India. ' Department of Mechanical Engineering, Kalasalingam University, Anand Nagar, Krishnankoil – 626 190, Tamil Nadu, India. ' Department of Computer Science and Engineering, Dr. Mahalingam College of Engineering and Technology, Pollachi-642 003, Tamil Nadu, India. ' G.K.M. College of Engineering and Technology, Chennai-600 063, Tamil Nadu, India

Abstract: In this modern digital age, software based Mechatronics is an emerging technology which is widely used in manufacturing industries. A Programmable Mechatronics system should contain high quality software and hardware components. To achieve a high quality system, reliability prediction of its components is an important initial process in the early design stage. Nowadays, software based Electro pneumatic systems are used in many manufacturing industries. The reliability analyses of various components involved in electro pneumatic system is necessary to initiate a smooth operation in application area. The Bayesian technique is a consistent formal modelling framework based on Bayesian statistics. It considers the uncertainties of unknown parameters. In this paper, Bayesian model is used to analyse the reliability of the software based electro pneumatic system in a systematic way. This attempt is helped to take a decision about the reliability of the system and also provides a sufficient confidence about the systems.

Keywords: reliability analysis; Bayesian model; Bayesian network; electropneumatic systems; failure modes; reliability assessment; mechatronics; uncertainties; software.

DOI: 10.1504/IJISE.2009.023544

International Journal of Industrial and Systems Engineering, 2009 Vol.4 No.3, pp.303 - 325

Published online: 27 Feb 2009 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article