Virtual metrology-based engineering chain management by multi-classification of quality using support vector machine for semiconductor manufacturing
by Sumika Arima
International Journal of Industrial and Systems Engineering (IJISE), Vol. 8, No. 1, 2011

Abstract: This paper suggested that engineering chain management (ECM) that manages technical information and the process is necessary for the semiconductor industry. A virtual metrology-based (VM) manufacturing management system was proposed. This system realised the ECM concept, succeeded in real-time quality prediction and served a consistent driver to actions of all divisions of work. Support vector machine (SVM) was applied to construct an accurate VM model that provided multi-class quality prediction of the product. Although only the equipment variable data of a real mass production factory was used as an input, the VM model predicted with 100% accuracy the quality of the product.

Online publication date: Sat, 31-Jan-2015

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