Title: Exploration of neural network models for defect detection and classification

Authors: B.V. Ajay Praskash; D.V. Ashoka; V.N. Manjunath Aradhya; C. Naveena

Addresses: Department of Computer Science and Engineering, SJB Institute of Technology, Bengaluru, Karnataka, India ' Department of Information Science and Engineering, JSSATE, Bengaluru, Karnataka, India ' Department of MCA, SJCE, Mysore, Karnataka, India ' Computer Science and Engineering, SJB Institute of Technology, Bengaluru, Karnataka, India

Abstract: In order to overcome the software development challenges like delivering a project on time, developing quality software products and reducing development cost, software industries commonly uses defect detection software tools to manage quality in software products. Defects are detected and classified based on their severity, this can be automated in order to reduce the development time and cost. Nowadays to extract useful knowledge from large software repositories, engineers and researchers are using data mining techniques. In this paper, software defect detection and classification method is proposed and neural network models such as generalised regression neural network (GRNN) and probabilistic neural network model (PNN) are integrated to identify, classify the defects from large software repository. Based on defects, severity proposed method discussed in this paper focuses on three layers: core, abstraction and application layer. The performance accuracy of the proposed model is compared with MLP and J48 classifiers.

Keywords: software bugs tracking; neural network models; software quality assurance; bug tracking; defect classification.

DOI: 10.1504/IJCONVC.2016.090081

International Journal of Convergence Computing, 2016 Vol.2 No.3/4, pp.220 - 234

Accepted: 27 Dec 2016
Published online: 28 Feb 2018 *

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