Title: Performance evaluation of SRF-based dynamic voltage restorer for mitigation of various power quality problems

Authors: Shubhendra Pratap Singh; Abdul Hamid Bhat

Addresses: Department of Electrical Engineering, National Institute of Technology Srinagar, Kashmir, 190006, India ' Department of Electrical Engineering, National Institute of Technology Srinagar, Kashmir, 190006, India

Abstract: Dynamic voltage restorer (DVR) is used to protect sensitive loads from harmonic distortion, sag/swell, and unbalance in supply voltage economically. In this paper, synchronous reference frame (SRF) theory-based algorithm has been developed for the production of compensating voltages for controlling DVR. Linear as well as nonlinear loads can be controlled by this algorithm. A three-phase programmable voltage source is taken for producing voltage sag/swell and voltage harmonic distortion and this voltage is compared with a reference voltage of same magnitude. At the time of any disturbance, an error signal is generated which is processed by controller based on SRF theory. The controller generates the gate pulses for PWM inverter energised by a DC source and inverter injects the missing voltage into the distribution line and tightly regulates the voltage at the load terminals. By extensive simulation studies in MATLAB/Simulink and SimPowerSystems environment, the above control strategy is tested. The simulation results for voltage harmonic distortion, voltage sag/swell, and voltage unbalanced mitigation using the proposed control algorithm prove the effectiveness of DVR.

Keywords: dynamic voltage restorer; DVR control; voltage sag; voltage swell; total harmonic distortion; THD; power quality; custom power devices; performance evaluation; synchronous reference frame; SRF; PWM inverters; pulse width modulation; simulation.

DOI: 10.1504/IJIED.2016.081581

International Journal of Industrial Electronics and Drives, 2016 Vol.3 No.2, pp.89 - 101

Received: 10 Aug 2016
Accepted: 13 Sep 2016
Published online: 15 Jan 2017 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article