Title: Integrated condition assessment for Navy system of systems

Authors: Patrick T. Hester; Kevin MacG. Adams; David J. Kern

Addresses: National Centers for System of Systems Engineering, Old Dominion University, 4111 Monarch Way Suite 406, Norfolk, Virginia 23508, USA ' National Centers for System of Systems Engineering, Old Dominion University, 4111 Monarch Way Suite 406, Norfolk, Virginia 23508, USA ' Kern Technology Group, LLC, 4445 Corporation Lane, Suite #250, Virginia Beach VA 23462, USA

Abstract: Although the US Navy has made great strides in integrating technology to monitor and assess the condition of sub-systems, little is understood about how to fuse this data in order to construct a higher level awareness of the ship's overall readiness or current state. Drawing upon systems theory and systems-based approaches, we identify principles of hierarchy, control, suboptimisation, and satisficing as critical propositions for fusing integrated condition data and propose the viable system model as a hierarchical construct for managing the complexity of fusing integrated data into higher level awareness. This research resulted in the development of a system-level decision process that represents the underlying process of maintaining awareness of system level condition. We feel that further study is needed to fully realise the potential of using the a system-level decision process in integrating data for condition-based assessment and suggest avenues of research in calculating system reliability in managing both aleatory and epistemic uncertainty resident in the system.

Keywords: system of systems engineering; SoSE; education; Navy system of systems; USA; United States; systems theory; integrated condition assessment; system level condition; system reliability; uncertainty.

DOI: 10.1504/IJSSE.2012.052692

International Journal of System of Systems Engineering, 2012 Vol.3 No.3/4, pp.356 - 367

Received: 17 Dec 2012
Accepted: 17 Dec 2012

Published online: 16 Aug 2014 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article