Title: Conceptual principles and ontology for a KBE implementation in inspection planning
Authors: Joaquin Barreiro, Susana Martinez, Eduardo Cuesta, Braulio Alvarez
Addresses: Department of Manufacturing Engineering, University of Leon, Campus de Vegazana, s/n, Leon, 24071, Spain. ' Department of Manufacturing Engineering, University of Leon, Campus de Vegazana, s/n, Leon, 24071, Spain. ' Department of Construction and Manufacturing Engineering, University of Oviedo, Campus de Gijon, Edificio 5, Gijon, 33204, Spain. ' Department of Construction and Manufacturing Engineering, University of Oviedo, Campus de Gijon, Edificio 5, Gijon, 33204, Spain
Abstract: The inspection process planning with coordinate measuring machines involves repetitive and well-known decisions to make about the different strategies to use, although much of this knowledge is today implicit in the expert mind. Therefore, the inspection planning is a good activity for implementing knowledge-based engineering (KBE) systems. However, the origin of KBE is in the design activity and, traditionally, the different methodologies have been applied to that activity. In this paper, the focus is the application of a known methodology traditionally used in the design process to the inspection process with coordinate measuring machines. The paper considers the knowledge elicitation phase, that is, the knowledge identification before its formalisation and implementation in a platform. The identification of knowledge is done in a high-abstraction level using a combination of IDEF0 diagrams and a text analysis application. The knowledge extracted was represented in a first approximation by means of a modified ontology to adapt the original MOKA ontology to the inspection process.
Keywords: coordinate measuring machines; CMMs; inspection planning; knowledge-based engineering; KBE; MOKA; ontology; process planning; IDEF0; text analysis.
International Journal of Mechatronics and Manufacturing Systems, 2010 Vol.3 No.5/6, pp.451 - 465
Published online: 17 Oct 2010 *Full-text access for editors Access for subscribers Purchase this article Comment on this article