Title: Characterisation of SAED pattern of TEM images of CdZnS thin films

Authors: Subhash Chandra Shrivastava; R. Shrivastava

Addresses: Department of Mathematics, Rungta College of Engineering and Technology, Bhilai, 490020, Chhattisgarh, India ' Department of Physics, Government Naveen College, Risali, Dist. – Durg, 490006, Chhattisgarh, India

Abstract: In this paper, the chemical bath deposition method is used to prepare CdZnS thin films at optimal conditions. Prepared CdZnS thin films have good adherence to microscopic glass slides and are thin and of uniform thickness. Characterisations of thin films have been done by X-ray diffraction, transmission electron microscopy and EDAX studies. SAED pattern and XRD pattern analysis, as well as their comparative studies, have been done. A grainy structure with a grain size of about 140 nm has been observed by TEM images. D-spacing is measured by the SAED pattern, which is also confirmed by XRD images.

Keywords: chemical bath deposition; thin films; selected area electron diffraction pattern; X-ray diffraction; EDAX spectra.

DOI: 10.1504/IJMATEI.2025.149443

International Journal of Materials Engineering Innovation, 2025 Vol.16 No.4, pp.343 - 351

Received: 15 Jul 2023
Accepted: 12 Nov 2023
Published online: 31 Oct 2025 *

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