Title: Scrap reduction using DMAIC in an automotive electronics manufacturer's cybersecurity process

Authors: Todd Lemon; M. Affan Badar; Alister McLeod

Addresses: Bailey College of Engineering and Technology, Indiana State University, Terre Haute, Indiana 47809, USA ' Bailey College of Engineering and Technology, Indiana State University, Terre Haute, Indiana 47809, USA ' Bailey College of Engineering and Technology, Indiana State University, Terre Haute, Indiana 47809, USA

Abstract: A scrap reduction activity is described in a new cybersecurity production process for electronic controller units (ECUs) at an automotive electronics manufacturer. The Lean Six Sigma tool DMAIC: define, measure, analyse, improve, and control, was used to optimise and stabilise the process. The historical yield data for the cybersecurity provisioning operation was gathered over the 16-week period. Pareto chart was used to find the root causes for defects then improvement plans were designed and implemented. The combined before-improvement defect rate was 2,400 PPM/week. After improvement, the sustained defect rate was 147 PPM/week. The realised yield improvements were controlled through data monitoring and yield collection over four weeks, indicating a sustained improvement that could be logged as a significant annual continuous improvement savings. This work expands the application of DMAIC into cybersecurity production processes. It also encourages engineering and quality managers to prepare action plans and apply DMAIC, Pareto, and a socio-technical approach in their organisations for process improvements and cost savings.

Keywords: Lean Six Sigma; DMAIC; Pareto chart; process improvement; annual saving; automotive electronics manufacturing; cybersecurity; socio-technical approach.

DOI: 10.1504/IJSSCA.2025.145643

International Journal of Six Sigma and Competitive Advantage, 2025 Vol.15 No.3, pp.315 - 332

Received: 18 Mar 2024
Accepted: 01 Nov 2024
Published online: 09 Apr 2025 *

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