Title: A finite element simulation for notch stress intensity factors of sharp center V-notched tensile configuration using strain gauge technique

Authors: Pranjol Paul; K.S.R. Krishna Murthy; Debabrata Chakraborty

Addresses: Department of Mechanical Engineering, IIT Guwahati, Guwahati, 781039, Assam, India ' Department of Mechanical Engineering, IIT Guwahati, Guwahati, 781039, Assam, India ' Department of Mechanical Engineering, IIT Guwahati, Guwahati, 781039, Assam, India

Abstract: The present paper aims at theoretical development of a strain gauge-based methodology for accurate determination of notch stress intensity factor (NSIF) in sharp center V-notched tensile configuration (CENT). In line with Dally-Sanford's single strain gauge technique for determination of stress intensity factor (SIF) in cracked configuration, theoretical formulations have first been developed for single edge notch tensile (SENT) specimen and the same is applied to CENT by making necessary changes. Efficacy of the theoretical formulations developed has been investigated by carrying out finite element (FE) simulation in extracting NSIF for CENT. Results from FE simulations show that the theoretical formulations developed could correctly guide in accurate extraction of NSIF from the strain gauge readings in the case of CENT. In addition, it was also observed that the bounds on the strain gauge location put forward by the present formulation has an important bearing on accuracy of extracted NSIF. Placing strain gauges within and outside the upper bound results in highly accurate (<5%) and highly erroneous (>30%) values of NSIF respectively.

Keywords: sharp center V-notch; NSIF; notch stress intensity factor; strain gauge technique; mode I; optimal radial strain gauge location.

DOI: 10.1504/IJCMSSE.2023.135843

International Journal of Computational Materials Science and Surface Engineering, 2023 Vol.11 No.3/4, pp.272 - 287

Received: 06 Feb 2023
Accepted: 28 Aug 2023

Published online: 08 Jan 2024 *

Full-text access for editors Full-text access for subscribers Purchase this article Comment on this article