Title: PUF based on chip comparison technique for trustworthy scan design data security against side channel attack

Authors: Shiny Mukkath I.; Nirmala Devi M.

Addresses: Department of Electronics and Communication Engineering, Amrita School of Engineering, Coimbatore, Amrita Vishwa Vidyapeetham, 641 112, India ' Department of Electronics and Communication Engineering, Amrita School of Engineering, Coimbatore, Amrita Vishwa Vidyapeetham, 641 112, India

Abstract: All fields of computational technology, including cloud computing and cryptography, are vulnerable to different types of external threads. Scan-based testing method is a well-known tool for testing integrated chips, but at the same time, it helps hacking the secret code from the chip. The scan hardware can act as a platform for attackers to hack the secret data from the chip. Most of the existing solutions are based on the alteration of the conventional scan structure with more complex design which focused only on security but violates the testability. In this paper, we propose a dynamic reconfiguration architecture using embedded PUF design, which protects the chip from brute force attack, hamming distance-based attack with optimal deployment configuration. Additional on-chip comparison and masking were also used to enhance security. The experimental results are evaluated on standard benchmark circuits.

Keywords: security; design for testing; DFT; physical unclonable function; PUF; on chip comparison; hardware as a service; automatic reconfiguration; data security.

DOI: 10.1504/IJCC.2023.130899

International Journal of Cloud Computing, 2023 Vol.12 No.2/3/4, pp.201 - 223

Received: 11 Jun 2020
Accepted: 01 Aug 2020
Published online: 14 May 2023 *

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