Title: Multi-release software reliability assessment: testing coverage-based approach

Authors: Anu G. Aggarwal; Sudeep Kumar; Ritu Gupta

Addresses: Department of Operational Research, University of Delhi, Delhi, India ' Department of Mathematics, AIAS, Amity University, Uttar Pradesh 201303, India ' Department of Mathematics, AIAS, Amity University, Uttar Pradesh 201303, India

Abstract: Software development companies continue to improve their products to stay up with the market's growing needs by adding new features and fixing previously identified bugs. Software reliability growth models (SRGMs) with testing effort function are the incredibly valuable and have been widely utilised by software engineers. Many researchers have built SRGMs that incorporate the concept testing coverage in the model building for the multi-release software system. The proposed model intends to give three different models of multi-release software reliability modelling with testing coverage function. Three models describe testing coverage by exponential function, delayed S-shaped function and logistic function respectively, with the testing effort function assumed to be Weibull in nature. Real-world data is used to estimate parameters in order to validate the proposed SRGM of four releases from Tandem Computers and the model goodness-of-fit is assessed. The results suggest that the proposed model matches the failure data effectively.

Keywords: SRGMs; software reliability; testing coverage; testing effort; NHPP.

DOI: 10.1504/IJMOR.2023.130122

International Journal of Mathematics in Operational Research, 2023 Vol.24 No.4, pp.583 - 594

Received: 28 Apr 2022
Accepted: 29 Apr 2022

Published online: 05 Apr 2023 *

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